Picarro is a leading provider of airborne molecular contamination (AMC) and chemical contaminant monitoring systems for advanced semiconductor fabs. Our precision metrology solutions detect inorganic and volatile organic compound (VOC) contaminants down to the parts-per-trillion (ppt) level in seconds, not hours. The speed and accuracy of our solutions enable semiconductor manufacturers to quickly mitigate contamination events in cleanrooms, FOUP, and lithography process equipment – improving production yield and reducing manufacturing and equipment maintenance costs. Applications for our solutions include:
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